X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.2 298 220mM ammonium sulfate, 20% PEG300, 15% glycerol, 100mM phosphate/citrate, pH 4.2, vapor diffusion, sitting drop, temperature 298K
Unit Cell:
a: 63.198 Å b: 76.087 Å c: 167.568 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 3.80 Solvent Content: 67.66
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD ? 2.400 20.000 32314 1652 100.000 0.218 0.259 60.692
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.400 25.725 99.600 ? 0.055 5.424 3.300 ? 32628 0.0 0.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.40 2.53 99.90 ? 0.475 1.5 3.40 4660
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA 0.9724 SLS X06SA
Software
Software Name Purpose Version
SCALA data scaling 3.3.9
SOLOMON phasing .
CNS refinement .
PDB_EXTRACT data extraction 3.005
ADSC data collection Quantum
MOSFLM data reduction .
SHARP phasing .