X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.00 278 PEG 4000, SODIUM CITRATE, 2- PROPANOL, GLYCEROL, PH 5.0, VAPOR DIFFUSION, SITTING DROP, TEMPERATURE 288K, PH 5.00, temperature 278K
Unit Cell:
a: 109.494 Å b: 163.456 Å c: 164.352 Å α: 117.04° β: 95.74° γ: 107.23°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.13 Solvent Content: 60.46
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.30 20.00 339025 17920 86.34 0.16743 0.22237 27.202
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.300 55.400 86.3 0.08200 0.05800 11.6000 2.400 ? 357511 ? 0.000 36.49
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.30 2.41 72.4 ? 0.28000 2.600 2.20 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 110.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RU200 ? ? ?
Software
Software Name Purpose Version
REFMAC refinement 5.5.0072
CNS refinement .
CrystalClear data collection .
MOSFLM data reduction .
CCP4 data scaling (SCALA)
CNS phasing .