X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 298.0 0.2M Magnesium acetate tetrahydrate 0.1M Sodium cacodylate trihydrate 20% Polyethylene glycol 8000, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 298.0K
Unit Cell:
a: 38.073 Å b: 61.882 Å c: 65.604 Å α: 115.83° β: 106.37° γ: 90.50°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.16 Solvent Content: 42.95
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.60 32.55 61066 3089 90.4 0.215 0.231 20.4
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.60 32.55 93.5 0.054 ? 13.6 3.6 63137 63137 0.0 0.0 26.8
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.60 1.63 65.5 ? ? 2.5 2.7 2197
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X29A 0.979 NSLS X29A
Software
Software Name Purpose Version
CNS refinement 1.1
CBASS data collection .
HKL-2000 data reduction .
HKL-2000 data scaling .
SHELXD phasing .
SHARP phasing .
ARP/wARP model building .