X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.0 293 15 % PEG 8000, 0.1 M BisTris pH 6.0, 0.15 M CaBr2, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Unit Cell:
a: 62.650 Å b: 79.950 Å c: 109.580 Å α: 81.71° β: 76.53° γ: 87.11°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.86 Solvent Content: 57.07
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION ? ? 2.600 27.633 59958 2998 95.38 0.2112 0.2545 60.853
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.600 30 95.200 0.042 ? ? ? ? 184838 ? -3.00 53.483
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.60 2.70 95.20 ? ? 2.2 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON EMBL/DESY, HAMBURG BEAMLINE X13 ? EMBL/DESY, HAMBURG X13
Software
Software Name Purpose Version
XSCALE data processing .
PHENIX refinement .
PDB_EXTRACT data extraction 3.006
MAR345dtb data collection .
XDS data reduction .
XSCALE data scaling .