X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.0 ? 24% V/V PEG 200, 6% W/V PEG 3350, 16MM MANGANESE(II) CHLORIDE, 20MM SPERMINE TETRACHLORIDE, 0.1M MES BUFFER (PH 6.0), VAPOR DIFFUSION, HANGING DROP, TEMPERATURE 293K
Unit Cell:
a: 26.544 Å b: 26.544 Å c: 162.129 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 41 21 2
Crystal Properties:
Matthew's Coefficient: 2.94 Solvent Content: 58.19
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD FREE R 1.10 20.00 ? 1177 94.3 0.162 0.196 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.100 30.000 92.2 0.03280 ? 24.0600 5.200 ? 23140 ? 1.000 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.10 1.20 76.5 ? ? 4.440 2.17 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA ? SLS X10SA
Software
Software Name Purpose Version
SHELXD phasing .
SHELXL-97 refinement .
XDS data reduction .
SAINT data reduction .
SADABS data scaling .