X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.0 290 HAMPTON SCREEN, B5: 30% PEG 4000, 200MM LI2SO4, 100MM TRIS PH 8,, VAPOR DIFFUSION, SITTING DROP, temperature 290K
Unit Cell:
a: 62.230 Å b: 66.000 Å c: 63.760 Å α: 90.00° β: 113.69° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.27 Solvent Content: 46
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.10 20 26320 1395 99.8 0.238 0.295 29.82
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.100 20 99.5 0.072 ? 17.02 7.4 27839 27703 0 -3.000 42.51
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.10 2.15 99.8 ? 0.618 3.1 7.6 2051
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X8C 0.9791 NSLS X8C
Software
Software Name Purpose Version
SHARP phasing .
PARROT phasing .
ARP/wARP model building .
REFMAC refinement 5.5.0088
XDS data reduction .
XSCALE data scaling .