X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 294 0.1M HEPES, pH7.5, 12% PEG3350, 5mM cobalt chloride hexahydrate, 5mM nickel (II) chloride hexahydrate, 5mM cadmium chloride dehydrate, 5mM magnesium chloride hexahydrate, VAPOR DIFFUSION, HANGING DROP, temperature 294K
Unit Cell:
a: 111.448 Å b: 111.448 Å c: 84.333 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: H 3 2
Crystal Properties:
Matthew's Coefficient: 3.19 Solvent Content: 61.44
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD ? 2.0 25.0 21159 1006 80.2 0.215 0.2401 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.0 50 92.6 0.054 0.088 ? 5.8 24473 24473 0.0 0.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.0 2.07 68.2 ? 0.269 ? 3.8 1790
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X12C 0.9206,0.9208 NSLS X12C
Software
Software Name Purpose Version
CBASS data collection .
SnB phasing .
CNS refinement .
HKL-2000 data reduction .
HKL-2000 data scaling .