X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 277 100mM TRIS-HCl, pH 8.5, 2.25M NaCl, 15% (w/v) PEG 6000, 5mM GDP, 5mM AlCl3, 50mM NaF, VAPOR DIFFUSION, HANGING DROP, temperature 277K
Unit Cell:
a: 130.804 Å b: 130.804 Å c: 200.611 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: I 41 2 2
Crystal Properties:
Matthew's Coefficient: 4.11 Solvent Content: 70.08
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MIR THROUGHOUT 2.95 19.90 17528 941 99.16 0.23383 0.26951 106.210
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.95 25 98.9 0.077 0.061 24.5 7.16 18710 18513 ? ? 86.639
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.95 3.00 99.7 ? ? 2.4 7.28 895
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 0.98003 SLS X10SA
Software
Software Name Purpose Version
MOLREP phasing .
REFMAC refinement 5.2.0019
XDS data reduction .
XSCALE data scaling .