3GA4

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 277 18% PEG 3350, 50 mM Na-citrate, pH 3.0, protein solution buffer: 50 mM Tris-HCl, pH 8.0 , VAPOR DIFFUSION, SITTING DROP, temperature 277K
Unit Cell:
a: 58.989 Å b: 61.076 Å c: 106.985 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: I 2 2 2
Crystal Properties:
Matthew's Coefficient: 2.37 Solvent Content: 48.07
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION FOURIER SYNTHESIS ? 1.300 20.000 47808 2309 99.94 0.1548 0.1873 20.7
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.3 20.0 99.9 ? 0.052 22.4 7.3 ? 47810 ? -3.0 11.4
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.3 1.4 99.7 ? 0.441 4.5 5.9 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA 0.85506 SLS X06SA
Software
Software Name Purpose Version
RemDAq data collection .
SHELXE model building .
autoSHARP phasing .
PHENIX refinement (phenix.refine)
XDS data reduction .
XSCALE data scaling .