X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.0 298 Plug-based microfluidics, Precipitant was mixed with buffer and RC sample in a microfluidic chip. The final precipitant concentration was ~1.7 M ammonium sulfate, 0.1% LDAO,30 mM NaH2PO4-Na2HPO4, pH 6.0, 3% 1,2,3-heptanetriol, 1.9% triethylammonium phosphate. RC concentration was ~ 9.4 mg/mL, Microbatch, temperature 298K
Unit Cell:
a: 220.132 Å b: 220.132 Å c: 112.744 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 43 21 2
Crystal Properties:
Matthew's Coefficient: ? Solvent Content: ?
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.50 20.00 90386 4765 99.21 0.17726 0.20556 31.995
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.5 50 ? 0.137 ? ? 7.1 ? 95377 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.5 2.59 ? ? ? ? 6.2 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 14-BM-C ? APS 14-BM-C
Software
Software Name Purpose Version
HKL-2000 data collection .
CCP4 model building .
REFMAC refinement 5.2.0019
HKL-2000 data reduction .
HKL-2000 data scaling .
CCP4 phasing .
Feedback Form
Name
Email
Institute
Feedback