X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.80 292 PEG 6000, KCl, NH4Cl, MgCl2, pH 5.80, VAPOR DIFFUSION, SITTING DROP, temperature 292K
Unit Cell:
a: 212.207 Å b: 299.544 Å c: 574.251 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: C 2 2 21
Crystal Properties:
Matthew's Coefficient: 3.15 Solvent Content: 61.01
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION FOURIER SYNTHESIS THROUGHOUT 2.850 49.760 384681 3763 91.200 ? 0.233 66.305
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.85 50.0 98.600 0.109 ? 13.200 5.900 ? 415775 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.85 2.95 98.60 ? ? ? 5.60 41340
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-C 1.0000 APS 24-ID-C
Software
Software Name Purpose Version
DENZO data reduction .
SCALEPACK data scaling .
CNS refinement 1.0
PDB_EXTRACT data extraction 3.006
HKL-2000 data collection .
HKL-2000 data reduction .
CNS phasing .
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