ISDA: 3G1J

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	4.6	296	0.1M Na(OAC), 0.2M NaFormate, pH 4.6, VAPOR DIFFUSION, SITTING DROP, temperature 296K

Unit Cell:

a: 121.043 Å b: 121.043 Å c: 27.014 Å α: 90.00° β: 90.00° γ: 120.00°

Symmetry:

Space Group: P 62

Crystal Properties:

Matthew's Coefficient: 2.56 Solvent Content: 52.00

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	SAD	THROUGHOUT	1.700	24.66	24120	1879	94.68	0.1938	0.2189	?

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1.7	24.668	91.7	0.041	0.041	37.14	6.4	25217	25217	0	0	28.65

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.70	1.73	100.0	?	0.615	2.2	5.1	1234

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	APS BEAMLINE 19-BM	0.97942	APS	19-BM

Software