ISDA: 3G04

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	6.00	292	8% PEG 8000, 0.1M MES, 0.25M ZINC ACETATE, pH 6.00, VAPOR DIFFUSION, HANGING DROP, temperature 292K

Unit Cell:

a: 43.888 Å b: 175.784 Å c: 205.806 Å α: 90.00° β: 90.00° γ: 90.00°

Symmetry:

Space Group: I 21 21 21

Crystal Properties:

Matthew's Coefficient: 2.66 Solvent Content: 53.82

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	2.55	26.72	24426	1301	96.0	0.184	0.245	36.00

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.550	30.000	96.1	0.07100	0.07100	10.5000	4.600	26775	25731	?	2.500	47.70

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.55	2.61	99.2	?	0.361	?	4.40	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100.0 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	SRS BEAMLINE PX14.2	0.98	SRS	PX14.2

Software