X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.0 297 20% PEG 8000, 0.1 M MES pH 6.0, 0.2 M Ca(OAc)2, VAPOR DIFFUSION, SITTING DROP, temperature 297K
Unit Cell:
a: 47.769 Å b: 48.724 Å c: 95.206 Å α: 94.61° β: 100.46° γ: 90.10°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.38 Solvent Content: 48.29
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 2.40 50.00 31955 1625 97.05 0.20696 0.26003 28.089
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.40 50.0 98.3 0.138 ? 13.61 3.6 34133 32314 ? -3.0 32.80
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.40 2.42 97.6 ? ? 3.03 3.3 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97920, 0.97940 APS 19-ID
Software
Software Name Purpose Version
SBC-Collect data collection .
HKL-3000 phasing .
MLPHARE phasing .
DM model building .
SHELXD phasing .
RESOLVE model building .
Coot model building .
REFMAC refinement 5.5.0054
HKL-3000 data reduction .
HKL-3000 data scaling .
DM phasing .
RESOLVE phasing .