X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.90 293 0.05 M magnesium chloride, 0.4 M Na CL, 0.05 M TRIS, 7% PEG 3350, 0.5 mM Na6H2W12O40, pH 7.90, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 83.16 Å b: 83.16 Å c: 106.85 Å α: 90.0° β: 90.0° γ: 120.0°
Symmetry:
Space Group: P 61
Crystal Properties:
Matthew's Coefficient: 2.98 Solvent Content: 58.40
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION FOURIER SYNTHESIS THROUGHOUT 1.90 20.00 32232 3591 89.6 0.200 0.227 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.9 20.000 97.7 0.092 0.092 12.9 11.3 32991 32232 ? 0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.9 2.0 89.6 ? 0.420 3.5 8.2 3591
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON CLSI BEAMLINE 08ID-1 0.97 CLSI 08ID-1
Software
Software Name Purpose Version
CLS data collection on-site software
CNS refinement .
DENZO data reduction .
LSCALE data scaling .
CNS phasing .
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