X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.4 277 24% PEG 4000, 50 mM Tris HCl, 250 mM KCl, 20% glycerol, pH 7.4, VAPOR DIFFUSION, SITTING DROP, temperature 277K
Unit Cell:
a: 67.180 Å b: 62.795 Å c: 95.605 Å α: 90.000° β: 90.530° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.21 Solvent Content: 44.37
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION ? THROUGHOUT 1.550 39.130 111293 5565 96.4 0.186 0.217 22.159
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.550 39.13 96.400 0.056 ? ? ? 111321 111321 0.0 -3.00 25.661
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.55 1.65 90.80 ? ? 3.8 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 0.9994 SLS X10SA
Software
Software Name Purpose Version
XSCALE data scaling .
REFMAC refinement 5.2.0005
PDB_EXTRACT data extraction 3.006
MAR345 data collection CCD detector software
XDS data reduction .