ISDA: 3FSD

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	?	293	20.0% polyethylene glycol 3350, 0.2M magnesium chloride, ADDITIVE: 0.001M uridine 5'-monophosphate (UMP), NANODROP, VAPOR DIFFUSION, SITTING DROP, temperature 293K.

Unit Cell:

a: 61.018 Å b: 61.018 Å c: 56.442 Å α: 90.000° β: 90.000° γ: 90.000°

Symmetry:

Space Group: P 42 21 2

Crystal Properties:

Matthew's Coefficient: 1.80 Solvent Content: 31.57

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MAD	THROUGHOUT	1.700	27.287	12236	585	99.950	0.175	0.221	24.583

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1.70	27.287	100.000	0.095	0.095	15.8	9.400	?	12272	?	?	20.479

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.70	1.74	100.0	?	0.755	2.4	9.60	884

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	SSRL BEAMLINE BL11-1	0.97867,0.97776,0.91162	SSRL	BL11-1

Software