X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.5 277 0.2M Li2SO4, 0.1M Acetate, 2.5M NaCl, pH 4.5, VAPOR DIFFUSION, SITTING DROP, temperature 277K
Unit Cell:
a: 63.711 Å b: 126.549 Å c: 112.807 Å α: 90.00° β: 94.52° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.54 Solvent Content: 51.49
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.32 41.45 72287 3823 99.01 0.20003 0.26346 22.447
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.32 42.0 99.9 0.115 ? 16.5 4.0 76418 76418 0 0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.33 2.37 99.9 ? ? 1.71 3.8 3866
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97929 APS 19-ID
Software
Software Name Purpose Version
SBC-Collect data collection .
SHELXD phasing .
MLPHARE phasing .
DM model building .
RESOLVE model building .
HKL-3000 phasing .
REFMAC refinement 5.5.0054
HKL-3000 data reduction .
HKL-3000 data scaling .
DM phasing .
RESOLVE phasing .