X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.60 298 30 % PEG 1500, HEPES, PH 6.6, vapor diffusion, hanging drop, temperature 298K
Unit Cell:
a: 80.147 Å b: 80.147 Å c: 323.170 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 65 2 2
Crystal Properties:
Matthew's Coefficient: 2.94 Solvent Content: 58.15
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.700 40.070 17830 899 99.600 0.214 0.274 44.146
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.7 50 99.8 0.062 ? 59.8 20.1 ? 17948 1.0 ? 35.600
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.7 2.8 99.8 ? ? 18.4 21.2 2105
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PHOTON FACTORY BEAMLINE BL-6B 1.000 Photon Factory BL-6B
Software
Software Name Purpose Version
CNS refinement .
PDB_EXTRACT data extraction 3.006
HKL-2000 data collection .
HKL-2000 data reduction .
HKL-2000 data scaling .
CNX phasing 2005
CNX refinement 2005