3FNV

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.0 300 100 mM Tris-HCl pH 8.0, 100 mM NaCl, 15% PEG 3000, VAPOR DIFFUSION
Unit Cell:
a: 40.904 Å b: 48.579 Å c: 74.104 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 1.94 Solvent Content: 36.58
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 2.100 37.060 9013 450 99.230 0.172 0.216 35.795
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.80 48.56 98.600 0.143 ? 16.17 25.9 ? 14086 ? -3.00 34.594
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.80 1.86 97.90 ? ? 1.9 17.9 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL9-2 1.7418, 1.3624, 1.7372 SSRL BL9-2
Software
Software Name Purpose Version
XSCALE data scaling .
SHARP phasing .
RESOLVE phasing 2.13
REFMAC refinement .
PDB_EXTRACT data extraction 3.006
Blu-Ice data collection .
XDS data reduction .
SHELX phasing .