X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 295 0.1 M HEPES, 10% (w/v) PEG 8000, 10% (w/v) ETHYLENE GLYCOL , pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 295K
Unit Cell:
a: 42.229 Å b: 60.915 Å c: 72.116 Å α: 101.19° β: 90.10° γ: 89.97°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.09 Solvent Content: 41.22
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.30 30.0 28727 1530 97.15 0.23215 0.27555 40.231
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.3 30.0 97.1 0.051 ? ? 2.0 30257 30257 ? -3 67.6
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.3 2.34 91.2 ? ? ? 1.9 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-D 0.97872 APS 21-ID-D
Software
Software Name Purpose Version
Blu-Ice data collection Max
Coot model building .
ARP/wARP model building .
REFMAC refinement 5.5.0051
HKL-2000 data reduction .
HKL-2000 data scaling .
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