X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 277 1.5M ammonium sulfate, 12% glycerol, 0.1M TrisHCl, pH 8.5, microbatch under oil , temperature 277K
Unit Cell:
a: 94.848 Å b: 32.021 Å c: 33.287 Å α: 90.00° β: 106.45° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 1.75 Solvent Content: 29.89
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.45 45.50 16237 866 99.63 0.16047 0.17643 17.003
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.45 50.0 96.1 0.040 ? 33.75 3.6 33173 31879 0.0 0.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.45 1.50 99.3 ? ? 4.9 3.0 3311
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X4C 0.97869 NSLS X4C
Software
Software Name Purpose Version
HKL-2000 data collection .
SnB phasing .
RESOLVE model building .
REFMAC refinement 5.2.0019
HKL-2000 data reduction .
SCALEPACK data scaling .
RESOLVE phasing .