X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.0 293 3:1 ratio of protein (2 mg ml-1) and well buffer (0.1 M ADA, pH 6.0, 10% (w/v) PEG monomethyl ether 5K, 0.2 M LiSO4, 3% (v/v) isopropanol, 5 mM DTT), VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 85.480 Å b: 111.620 Å c: 149.840 Å α: 77.09° β: 88.12° γ: 70.35°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.99 Solvent Content: 69.14
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 3.00 29.90 99867 5002 98.2 0.220 0.265 81.0
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.00 50 98.5 ? 0.077 ? 3.7 99867 99867 ? -3 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.00 3.11 98.2 ? 0.497 2.6 3.6 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X29A 0.9792, 0.9794, 0.9640 NSLS X29A
Software
Software Name Purpose Version
CBASS data collection .
SHELXS phasing .
CNS refinement 1.2
DENZO data reduction .
SCALEPACK data scaling .
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