X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 295 0.1M HEPES sodium salt, 2% PEG 400, 2.0 M Ammonium sulfate , pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 295K
Unit Cell:
a: 89.099 Å b: 89.099 Å c: 31.599 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 43
Crystal Properties:
Matthew's Coefficient: 2.42 Solvent Content: 49.17
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.90 89.09 5723 262 ? 0.256 0.279 49.43
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.900 89.090 99.6 0.068 0.068 25.9600 4.000 5778 5778 ? -3 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.90 3.00 100.0 ? 0.501 2.700 4.10 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-D 0.97869 APS 21-ID-D
Software
Software Name Purpose Version
SHARP phasing .
ARP/wARP model building .
O model building .
REFMAC refinement 5.5.0051
Blu-Ice data collection Max
HKL-2000 data reduction .
HKL-2000 data scaling .
Coot model building .