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X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.8 277 0.1 M Bis-Tris (pH 6.8), 0.2 M Ammonium Acetate, and 30% polyethylene glycol 3350 was combined at a 1:1 ratio with 20ExsD solution at 15 mg/ml in 25 mM Tris-HCl (pH 7.4), 0.15 M NaCl, 2 mM TCEP, VAPOR DIFFUSION, SITTING DROP, temperature 277K
Unit Cell:
a: 144.755 Å b: 69.347 Å c: 86.331 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 2
Crystal Properties:
Matthew's Coefficient: 2.49 Solvent Content: 50.66
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD ? 2.60 29.40 23613 1213 86.4 0.215 0.263 50.17
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.600 29.401 92.5 0.11000 0.11000 ? 8.000 ? 23616 ? -3.000 49.30
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.60 2.69 57.4 ? 0.39000 1.700 4.00 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X29A ? NSLS X29A
Software
Software Name Purpose Version
DENZO data reduction .
SCALEPACK data scaling .
RESOLVE phasing .
PHENIX refinement .
PDB_EXTRACT data extraction 3.006
PHENIX phasing .
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