X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 298 55% saturated ammonium sulfate, 100 mM Na citrate followed by transfer to 90% saturated ammonium sulfate, 100 mM Na citrate (pH 5.5) and 1 mM hydrogen peroxide, VAPOR DIFFUSION, HANGING DROP, temperature 298K
Unit Cell:
a: 62.563 Å b: 62.563 Å c: 163.745 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 61 2 2
Crystal Properties:
Matthew's Coefficient: 2.94 Solvent Content: 58.19
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.35 45.00 ? 1994 ? 0.128 0.176 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.350 50.000 93.6 ? 0.05500 22.62 4.500 ? 39844 ? 0.000 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.35 1.40 58.0 ? 0.32000 2.100 2.00 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 90 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 12.3.1 ? ALS 12.3.1
Software
Software Name Purpose Version
HKL-2000 data collection .
XFIT data reduction .
SHELXL-97 refinement .
HKL-2000 data reduction .
HKL-2000 data scaling .