X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 298 0.1M HEPES 7.5, 20%PEG4000, 25% Iso-propanol, VAPOR DIFFUSION, SITTING DROP, temperature 298K
Unit Cell:
a: 75.597 Å b: 72.500 Å c: 47.560 Å α: 90.00° β: 124.41° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.25 Solvent Content: 45.42
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.06 36.25 12412 517 94.2 0.213 0.257 30.4
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.06 50 96.5 0.063 ? 28.8 4.2 12920 12920 0.0 0.0 34.4
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.06 2.13 83.9 ? ? 2.0 3.3 1120
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X12C 0.9795 NSLS X12C
Software
Software Name Purpose Version
CBASS data collection .
SHELX model building .
SHARP phasing .
ARP model building .
WARP model building .
CNS refinement 1.1
HKL-2000 data reduction .
HKL-2000 data scaling .
SHELX phasing .