X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 283 50% MPD, 100mM Tris-HCl, 20mM Ammonium dihydrogen phosphate, 1mM DTT , pH 8.5, VAPOR DIFFUSION, SITTING DROP, temperature 283K
Unit Cell:
a: 95.930 Å b: 95.930 Å c: 165.810 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: I 41 2 2
Crystal Properties:
Matthew's Coefficient: 2.46 Solvent Content: 50.04
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION FOURIER SYNTHESIS THROUGHOUT 1.750 25.000 37574 1887 95.630 0.174 0.205 33.553
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.750 26.2 95.500 0.056 ? 16.0 5.2 ? 37583 ? -3.00 32.677
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.75 1.80 81.60 ? ? 2.6 3.6 9296
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 0.9920 SLS X10SA
Software
Software Name Purpose Version
XSCALE data scaling .
REFMAC refinement .
PDB_EXTRACT data extraction 3.006
MAR345 data collection .
XDS data reduction .
REFMAC phasing 5.2.0019
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