X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 298 30% PEG1500, 0.1M Tris pH 7.5, 0.3 M NaCl, VAPOR DIFFUSION, HANGING DROP, temperature 298K
Unit Cell:
a: 96.06 Å b: 96.06 Å c: 80.53 Å α: 90° β: 90° γ: 120°
Symmetry:
Space Group: P 65
Crystal Properties:
Matthew's Coefficient: 3.12 Solvent Content: 60.63
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 1.9 50 32496 1609 97.5 ? 0.2818 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.9 50 97.5 ? ? ? ? 33320 32496 2.0 2.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RU300 1.54 ? ?
Software
Software Name Purpose Version
CrystalClear data collection .
AMoRE phasing .
CNX refinement .
HKL-2000 data reduction .
SCALEPACK data scaling .
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