X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.0 281 80mM potassium phosphate, 0-1% PEG 2000, 0.05-0.1% protamine sulfate, pH 6.0, VAPOR DIFFUSION, HANGING DROP, temperature 281K
Unit Cell:
a: 151.370 Å b: 151.370 Å c: 153.740 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 43 21 2
Crystal Properties:
Matthew's Coefficient: 3.55 Solvent Content: 65.32
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.900 29.970 39635 1982 98.790 0.183 0.216 80.719
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.9 30 98.6 0.0073 0.0083 25.07 10.5 ? 39657 0 -3 72.85
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.9 3.0 99.6 ? 0.739 2.54 9.5 3800
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RUH2R 1.54179 ? ?
Software
Software Name Purpose Version
SCALA data scaling .
PHASER phasing .
PHENIX refinement .
PDB_EXTRACT data extraction 3.006
CrystalClear data collection .
XDS data reduction .
XSCALE data scaling .