X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 295 2 M ammonium sulfate, 0.1 M Hepes 7.5, 1% PEG550 MME plus 0.015 mg/ml chymotrypsin. Cryoprotected in 20% ethylene glycol, VAPOR DIFFUSION, SITTING DROP, temperature 295K
Unit Cell:
a: 93.479 Å b: 93.479 Å c: 48.596 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 63 2 2
Crystal Properties:
Matthew's Coefficient: 2.85 Solvent Content: 56.80
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.25 41.67 6296 291 99.8 0.193 0.221 41.05
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.000 100.000 99.2 0.08000 ? 50.00 15.800 ? 8834 ? 0.000 33.90
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.00 2.03 88.7 ? ? 2.330 9.80 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID ? APS 19-ID
Software
Software Name Purpose Version
HKL-3000 data collection .
SHELXCD phasing .
SHELXE model building .
REFMAC refinement 5.2.0019
HKL-3000 data reduction .
HKL-3000 data scaling .