X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 291.0 0.12M Magnesium chloride hexahydrate, 0.1M HEPES pH 7.5, 22% w/v PEG 3350 , VAPOR DIFFUSION, temperature 291.0K
Unit Cell:
a: 41.364 Å b: 43.985 Å c: 49.266 Å α: 78.25° β: 79.45° γ: 73.39°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.17 Solvent Content: 43.32
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.00 28.55 19345 1060 93.65 0.17846 0.22970 28.159
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.0 50.0 82.3 0.299 ? ? 3.0 ? 22223 0 0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.00 2.05 85.2 ? ? 3.6 3.0 68291
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU MICROMAX-007 1.5418 ? ?
Software
Software Name Purpose Version
HKL-2000 data collection .
CCP4 model building .
REFMAC refinement 5.2.0019
HKL-2000 data reduction .
HKL-2000 data scaling .
CCP4 phasing .
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