X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.6 293 5% PEG 2000, 50% Ethylene glycol, 0.1 M Sodium acetate, pH 4.6, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Unit Cell:
a: 87.039 Å b: 127.586 Å c: 87.155 Å α: 90.00° β: 92.96° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 3.21 Solvent Content: 61.66
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.30 38.21 80211 4052 95.2 0.223 0.258 33.7
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.3 50.0 100.0 0.114 ? 11.0 7.5 85247 85247 0.0 0.0 14.3
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.3 2.38 100 ? ? 2.5 7.1 8450
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X12C 0.979 NSLS X12C
Software
Software Name Purpose Version
CBASS data collection .
SHELXD phasing .
SHARP phasing .
ARP/wARP model building .
CNS refinement 1.1
HKL-2000 data reduction .
HKL-2000 data scaling .
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