3ESM

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 3.5 294 100mM citric acid pH 3.5, 2.0M ammonium sulfate, Vapor diffusion, temperature 294K
Unit Cell:
a: 67.582 Å b: 67.582 Å c: 62.571 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 32 1 2
Crystal Properties:
Matthew's Coefficient: 2.58 Solvent Content: 52.26
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.650 20.000 19809 1029 99.950 0.232 0.262 33.090
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.650 29.735 100.000 0.081 0.081 20.2 18.700 19837 19837 0 0 24.0
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.65 1.74 99.90 ? 0.531 3.5 18.70 2885
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 31-ID 0.97958 APS 31-ID
Software
Software Name Purpose Version
SCALA data scaling 3.2.25
REFMAC refinement .
PDB_EXTRACT data extraction 3.006
MAR345 data collection CCD
MOSFLM data reduction .
SHELXCD phasing .
SHELXE model building .