X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION
X-RAY DIFFRACTION
X-RAY DIFFRACTION
Unit Cell:
a: 459.266 Å b: 459.266 Å c: 459.266 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: F 2 3
Crystal Properties:
Matthew's Coefficient: ? Solvent Content: ?
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION AB INITIO PHASING THROUGHOUT 3.30 48.96 89413 5407 74.9 ? 0.267 52.0
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.3 50 75.3 0.206 ? 4.08 1.8 ? 119427 2 2 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.30 3.42 74.1 ? ? 1.61 1.8 8783
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 274 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON CHESS BEAMLINE F1 0.91790 CHESS F1
Software
Software Name Purpose Version
HKL-2000 data collection .
RAVE model building .
CNS refinement 1.2
HKL-2000 data reduction .
SCALEPACK data scaling .
RAVE phasing .