X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 293 pH 6.5, VAPOR DIFFUSION, temperature 293K
Unit Cell:
a: 46.053 Å b: 105.445 Å c: 121.981 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: I 21 21 21
Crystal Properties:
Matthew's Coefficient: 4.05 Solvent Content: 69.64
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 1.83 20 23786 1287 94.06 0.194 0.234 31.16
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.830 50 94.5 0.043 ? 37.9 6.7 28677 27100 0 0 19
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.83 1.87 70.1 ? ? 3.300 4 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE BM14 0.9464 ESRF BM14
Software
Software Name Purpose Version
HKL-2000 data collection .
PHASES phasing .
REFMAC refinement 5.1.24
HKL-2000 data reduction .
HKL-2000 data scaling .