X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.60 298 6% (W/V) POLYETHYLENE GLYCOL 600, 50 MM SODIUM CITRATE, 10% (V/V) 2-PROPONAL, pH 5.60, VAPOR DIFFUSION, SITTING DROP, temperature 298K
Unit Cell:
a: 169.100 Å b: 169.100 Å c: 169.100 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 43 3 2
Crystal Properties:
Matthew's Coefficient: 2.51 Solvent Content: 50.90
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.20 20.00 36706 1853 86.54 0.1655 0.2068 29.49
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.150 30.000 87 0.12900 ? 5.0000 5.000 41641 41641 0 0.000 27.796
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.15 2.23 63.2 ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 298.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RU200 1.54 ? ?
Software
Software Name Purpose Version
PHENIX model building .
PHASER phasing .
BUSTER-TNT refinement 2.1.1
DENZO data reduction .
SCALEPACK data scaling .
PHENIX phasing .
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