X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.50 298 PROPLEX-96 F9: 1.0M AMMONIUM SULPHATE, 100MM MES PH 6.5, VAPOR DIFFUSION, TEMPERATURE 298K, pH 6.50, VAPOR DIFFUSION, SITTING DROP
Unit Cell:
a: 91.870 Å b: 93.010 Å c: 143.700 Å α: 92.03° β: 107.58° γ: 109.65°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.54 Solvent Content: 51.58
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MR, MR THROUGHOUT 2.10 19.78 231826 11634 94.2 0.164 0.225 19.83
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.100 50 94.0 0.06100 0.061 11.0200 1.81 246609 231828 0 -3.000 30.60
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.10 2.15 92.5 ? 0.35400 2.300 1.71 16866
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 5.0.2 0.9999 ALS 5.0.2
Software
Software Name Purpose Version
BOS data collection .
MOLREP phasing .
REFMAC refinement 5.5.0046
XDS data reduction .
XSCALE data scaling .
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