ISDA: 3EH7

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	8.5	291	0.2M MgCl2, 0.1M Tris pH8.5, 16% PEG 4K, VAPOR DIFFUSION, SITTING DROP, temperature 291K

Unit Cell:

a: 72.704 Å b: 72.704 Å c: 133.694 Å α: 90.000° β: 90.000° γ: 120.000°

Symmetry:

Space Group: P 32 1 2

Crystal Properties:

Matthew's Coefficient: 2.11 Solvent Content: 41.70

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	SAD	THROUGHOUT	2.050	44.560	25521	1299	99.600	0.173	0.208	26.712

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.05	44.56	99.60	0.120	?	6.3	11	?	25521	?	-3	30.5

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.052	2.105	96.83	?	?	2.7	7	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	APS BEAMLINE 19-ID	0.97922	APS	19-ID

Software