X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 289.15 1.3-1.6M (NH4)2SO4, 3-6% polyethylene glycol 400, 10% Dioxane, 0.1M MES pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 289.15K
Unit Cell:
a: 92.509 Å b: 92.509 Å c: 142.429 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 31 2 1
Crystal Properties:
Matthew's Coefficient: 3.98 Solvent Content: 69.11
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 3.3 47.5 11004 1126 99.55 ? 0.295 95.5
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.3 50.0 99.6 ? 0.056 20.6 3.5 ? 11035 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.3 3.42 99.9 ? 0.424 2.3 3.6 1069
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 ? K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.2.1 1.0 ALS 8.2.1
Software
Software Name Purpose Version
BOS data collection .
PHENIX model building .
PHENIX refinement .
HKL-2000 data reduction .
HKL-2000 data scaling .
PHENIX phasing .