X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 291 25% PEG8000 (native crystals) or 20% PEG3350, pH6.5, VAPOR DIFFUSION, HANGING DROP, temperature 291K
Unit Cell:
a: 51.049 Å b: 59.825 Å c: 67.165 Å α: 96.55° β: 96.82° γ: 109.51°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 1.57 Solvent Content: 21.61
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD ? 2.2 50.0 31511 1563 ? 0.234 0.252 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.2 50.0 98 0.067 ? ? ? 33822 31554 0 ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.2 2.3 95 ? ? ? 2.2 2553
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.9798 APS 19-ID
Software
Software Name Purpose Version
HKL-2000 data collection .
MLPHARE phasing .
CNS refinement .
HKL-2000 data reduction .
HKL-2000 data scaling .
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