X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.2 291 0.4 M NH4(SO4)2, 1 M LiSO4, 0.1 M Na Citrate, pH 6.2, vapor diffusion, hanging drop, temperature 291K
Unit Cell:
a: 34.869 Å b: 66.474 Å c: 77.465 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: C 2 2 2
Crystal Properties:
Matthew's Coefficient: 2.72 Solvent Content: 54.85
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 2.000 28.690 6376 628 99.920 0.219 0.275 64.506
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.000 28.689 100.000 0.052 0.052 9.135 9.200 6417 6383 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.00 2.11 99.90 ? 0.757 1.0 8.90 902
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL9-2 1.2827,1.1808,1.2829 SSRL BL9-2
Software
Software Name Purpose Version
SCALA data scaling 3.2.25
REFMAC refinement 5.3.0037
PDB_EXTRACT data extraction 3.006
MOSFLM data reduction .