X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 298.0 0.1 M HEPES pH 7.5, 0.5 M Sodium Chloride, 1.6 M Ammonium Sulfate, VAPOR DIFFUSION, SITTING DROP, temperature 298.0K
Unit Cell:
a: 30.660 Å b: 85.500 Å c: 46.830 Å α: 90.00° β: 98.08° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 1.79 Solvent Content: 31.23
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MIR THROUGHOUT 2.01 46.37 15046 796 98.56 0.14545 0.21975 13.438
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.003 46.374 99.8 0.084 0.112 ? 4.23 ? 15775 2.0 2.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.00 2.12 29.5 ? 0.236 4.72 3.82 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 110.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON OTHER 1.433 ? ?
Software
Software Name Purpose Version
REFMAC refinement 5.2.0019
HKL-2000 data collection .
XDS data reduction .
SCALA data scaling .
SHARP phasing .