X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.0 293 10% (w/v) PEG 6000, 0.1M MES pH 6.0, 0.56mM CYMAL-6, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 79.090 Å b: 107.820 Å c: 119.030 Å α: 90.00° β: 96.97° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.54 Solvent Content: 51.54
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.50 49.05 68663 3540 99.8 0.220 0.280 48.79
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.500 50.000 99.9 0.10200 ? 14.9600 7.490 ? 68665 ? -3.000 50.46
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.50 2.60 100.0 ? ? 4.200 7.53 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X29A ? NSLS X29A
Software
Software Name Purpose Version
XSCALE data scaling .
SOLVE phasing 2.11
RESOLVE phasing 2.11
CNS refinement .
PDB_EXTRACT data extraction 3.006
XDS data reduction .