X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 290 0.1M MES pH 6.5, 0.55M Magnesium formate, 1.5% Glycerol, 0.25% N-octyl-beta-D-glucoside, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 290K
Unit Cell:
a: 135.083 Å b: 135.083 Å c: 135.083 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: I 2 3
Crystal Properties:
Matthew's Coefficient: 2.85 Solvent Content: 56.89
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.20 95.35 19088 1010 95.77 0.17747 0.23401 34.305
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.0 100.0 100.0 0.084 ? 37.98 22.1 27763 27763 ? ? 35.90
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.00 2.07 100.0 ? ? 4.6 22.2 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X25 1.10000 NSLS X25
Software
Software Name Purpose Version
REFMAC refinement 5.2.0019
CBASS data collection .
HKL-2000 data reduction .
HKL-2000 data scaling .
CNS phasing .