ELECTRON MICROSCOPY

Sample

eEF2-bound 80S complex in presence of AlF4-, and GDP

Specimen Preperation
Sample Aggregation State PARTICLE
Vitrification Instrument FEI VITROBOT MARK I
Cryogen Name ETHANE
Sample Vitrification Details ?
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles ?
Reported Resolution (Å) 12.6
Resolution Method ?
Other Details supervised classification was used (ref. Valle, M. et al, 2002, EMBO J.)
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space REAL
Refinement Protocol RIGID BODY FIT
Refinement Target ?
Overall B Value ?
Fitting Procedure ?
Details METHOD--Each domain fitted as rigid body, domains I (G and G), II,IV, and V were fitted. Domain III, and domain IV insertions were not included in this fitting model. The coordinates for this entry are based on manual fitting of the coordinates of the crystal structure 1N0U into cryo-EM density map. Therefore, authors did not deposit new structure factors.
Data Acquisition
Detector Type KODAK SO-163 FILM
Electron Dose (electrons/Å2) 10
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model FEI TECNAI F20
Minimum Defocus (nm) 4500
Maximum Defocus (nm) 1500
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS ?
Imaging Mode BRIGHT FIELD
Specimen Holder Model ?
Nominal Magnification 50000
Calibrated Magnification 49650
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 200
Imaging Details ?
Imaging Experiment
Task Software Package Version
MODEL FITTING O ?
RECONSTRUCTION SPIDER ?
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
. segregation in defocus groups and correction in volumes