X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.50 ? 100MM MES PH 6.5, 28% PEG MME 5K, 250MM AMMONIUM PHOSPHATE, VAPOR DIFFUSION, TEMPERATURE 294K, pH 8.50
Unit Cell:
a: 95.394 Å b: 134.571 Å c: 134.404 Å α: 90.00° β: 93.24° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.48 Solvent Content: 50.41
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.40 20.00 124742 3908 97.5 0.261 0.313 63.24
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.350 50.000 97.5 0.12500 0.12500 3.0000 1.900 ? 140651 ? 0.000 62.35
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.35 2.43 94.9 ? 0.83300 0.400 1.80 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 77.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 31-ID ? APS 31-ID
Software
Software Name Purpose Version
SHELXD phasing .
REFMAC refinement 5.2.0019
MOSFLM data reduction .
CCP4 data scaling (SCALA)