X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.6 292 100mM HEPES, 200mM MgCl2, 30% PEG 400, 5mM bis-pNPP, pH 7.6, VAPOR DIFFUSION, HANGING DROP, temperature 292K
Unit Cell:
a: 60.980 Å b: 60.980 Å c: 146.820 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 32 2 1
Crystal Properties:
Matthew's Coefficient: 2.28 Solvent Content: 46.12
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION Rigid body refinement of native structure 2q0i in REFMAC5 THROUGHOUT 1.80 19.96 28614 1495 99.95 0.15809 0.19627 25.648
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.8 20 99.8 0.053 ? 26 11 30154 30110 ? 4.3 35
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.8 1.9 99.9 ? ? 4.3 6.8 4432
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 0.97881 SLS X10SA
Software
Software Name Purpose Version
REFMAC refinement 5.2.0019
ADSC data collection Quantum
XDS data reduction .
XSCALE data scaling .
REFMAC phasing .