X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.0 293 1.5 M SODIUM FORMATE, 0.1 M SODIUM CITRATE, 0.1M CALCIUM CHLORIDE, pH 5.0, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Unit Cell:
a: 106.74 Å b: 106.74 Å c: 140.24 Å α: 90.0° β: 90.0° γ: 120.0°
Symmetry:
Space Group: P 31 2 1
Crystal Properties:
Matthew's Coefficient: 4.29 Solvent Content: 71.31
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.95 49.88 65812 3362 97.2 0.194 0.2 26.9
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.95 50.0 99.7 0.056 ? 22.3 13.5 67643 67643 0.0 0.0 15.0
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.95 2.02 96.8 ? ? 3.0 11.4 6473
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X12C 0.979 NSLS X12C
Software
Software Name Purpose Version
CNS refinement 1.1
CBASS data collection .
HKL-2000 data reduction .
HKL-2000 data scaling .
MOLREP phasing .