X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.50 293 100MM C2H3NAO2, 20% PEG 2000, 250MM (NH4)2SO4, 10MM DTE, pH 4.50, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 79.600 Å b: 88.000 Å c: 56.500 Å α: 90.00° β: 125.00° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.17 Solvent Content: 43.34
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.80 19.59 29320 1466 100.0 0.195 0.230 25.80
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.780 19.590 97.2 0.08600 ? 13.6400 ? ? 29894 ? 0.000 30.52
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.78 1.85 86.3 ? ? 4.100 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID14-4 0.933 ESRF ID14-4
Software
Software Name Purpose Version
AMoRE phasing .
REFMAC refinement 5.2
ADSC data collection Quantum
XDS data reduction .
XSCALE data scaling .